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以下這兩題 能請高手幫忙解答? 1. A phosphorus diffusion has a surface concentration of 5×10^18/cm3, and the background concentration of the p-type wafer is 1×1015/cm3. The Dt product for the diffusion is 10-8cm2 a. Find the junction depth for a Gaussian distribution b. Find the junction depth for an erfc profile Xj我算得是5.84x10^-4(很不確定= =) 2. Boron is implanted with an energy of 60 keV through a 0.25μm layer of silicon dioxide. The implanted dose is 1×10^14/cm2 a. Find the boron concentration at the silicon-silicon dioxide interface b. Find the dose in silicon. c. Determine the junction depth if the background concentration is 3×10^15/cm3 -- 當你什麼都不計較時 你就快樂了 -- ※ 發信站: 批踢踢實業坊(ptt.cc) ◆ From: 14.201.52.67
YU9527:Grad-ProbAsk 10/18 13:11