Electron are often involved in the surface characterization.  Why?

STM is an important instrument for surface topography.  Why?

Describe the similarity and difference in terms of information provided
by auger electron and electron microscopy.

Describe the enhancement matrix effect in XRF.

Describe the operation principle of measuring sulfur in gasoline by a
nondispersive XRF instrument.

Why is X-ray fluorescence not considered a surface analysis technique?

Explain that not all surface analyses are performed under high vacuum

Explain that the fabrication of the tunneling tip in STM is not as
difficult as might be expected.