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網址:http://ieeexplore.ieee.org/abstract/document/8256190/ 題目:Big data analytic for multivariate fault detection and classification in semiconductor manufacturing 作者:Ying-Jen Chen,Bo-Cheng Wang,Jei-Zheng Wu,Yi-Chia Wu,Chen-Fu Chien 請mail至:yeiway327@gmail.com 將提供微薄的100p (第一位) 感謝 -- ※ 發信站: 批踢踢實業坊(ptt.cc), 來自: 118.167.103.201 ※ 文章網址: https://www.ptt.cc/bbs/Master_D/M.1523200492.A.8BC.html
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